S2 plus Flying Probe Substrate Test

Manufacturer

atg Luther & Maelzer

Double Sided Tester for Substrate and HDI Boards

Key Features

  • 8 Test Heads
  • Fast Dual Shuttle System
  • High-speed direct linear drives for X and Z motion
  • No Probe Marks
  • 15 µm pad size and 30 µm pitch
  • 4 high-resolution cameras for fast optical scanning of top and bottom side
  • Fast 300 mA Kelvin testing
  • Test area 24″ x 12.2″ (610 mm x 310 mm)

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